Search results for: P. Delcroix
ICAME 2007 > 281-287
Microelectronics Reliability > 2013 > 53 > 12 > 1857-1862
Microelectronic Engineering > 2011 > 88 > 7 > 1376-1379
Journal of Raman Spectroscopy > 42 > 5 > 1202 - 1204
Electrochimica Acta > 2010 > 55 > 12 > 4007-4013
Hyperfine Interactions > 2008 > 183 > 1-3 > 109-115
Journal of Alloys and Compounds > 2007 > 434-435 > Complete > 584-586
Journal of Alloys and Compounds > 2007 > 434-435 > Complete > 587-589
Materials Science & Engineering A > 2004 > 367 > 1-2 > 1-8
Hyperfine Interactions > 2002 > 141-142 > 1-4 > 63-72
Journal of Alloys and Compounds > 2001 > 315 > 1-2 > 276-283
Hyperfine Interactions > 2000 > 130 > 1-4 > 45-70
Acta Materialia > 1998 > 46 > 9 > 3305-3316
Journal of Power Sources > 1997 > 64 > 1-2 > 35-37
Czechoslovak Journal of Physics > 1997 > 47 > 5 > 489-498
Czechoslovak Journal of Physics > 1997 > 47 > 5 > 489-498
Materials Science & Engineering A > 1996 > 207 > 1 > 97-104
Nanostructured Materials > 1996 > 7 > 1-2 > 127-135
Nanostructured Materials > 1995 > 6 > 5-8 > 617-620