Search results for: Jianping Zhang
Quality and Reliability Engineering International > 35 > 1 > 155 - 164
Luminescence > 33 > 1 > 34 - 39
Microelectronics Reliability > 2016 > 59 > C > 49-54
Journal of Luminescence > 2014 > 154 > Complete > 491-495
Solid State Electronics > 2012 > 75 > Complete > 102-106
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 715 - 720