Search results for: Yu Chen
2015 IEEE International Reliability Physics Symposium > 4A.5.1 - 4A.5.7
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3203 - 3206
IEEE Electron Device Letters > 2008 > 29 > 9 > 1071 - 1073
2015 IEEE International Reliability Physics Symposium > 4A.5.1 - 4A.5.7
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3203 - 3206
IEEE Electron Device Letters > 2008 > 29 > 9 > 1071 - 1073