Search results for: Ch. Förster
CISM International Centre for Mechanical Sciences > New Trends in Thin Structures: Formulation, Optimization and Coupled Problems > 175-203
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Growth and Defect Phenomena > 131-134
Materials Science & Engineering C > 2005 > 25 > 5-8 > 804-808
Thin Solid Films > 2004 > 455-456 > Complete > 695-699
Thin Solid Films > 2004 > 455-456 > Complete > 183-186
Applied Surface Science > 2001 > 184 > 1-4 > 79-83