Search results for: P. R. Wilshaw
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Processed Silicon and Other Device Materials > 355-358
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Scanning Electron and Scanning Probe Advances > 503-506
physica status solidi (a) > 212 > 8 > 1649 - 1661
Journal of Materials Science: Materials in Medicine > 2004 > 15 > 9 > 1021-1029