Search results for: T. Lin
2013 IEEE International Electron Devices Meeting > 9.1.1 - 9.1.4
2013 IEEE International Electron Devices Meeting > 31.2.1 - 31.2.4
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4
OECC 2010 Technical Digest > 284 - 285
IEEE Electron Device Letters > 2010 > 31 > 11 > 1290 - 1292