Search results for: I. A. Sysoev
Crystallography Reports > 2019 > 64 > 4 > 649-655
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2019 > 13 > 3 > 493-498
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2018 > 12 > 5 > 898-901
Semiconductors > 2018 > 52 > 8 > 993-996
Metallurgist > 2018 > 61 > 11-12 > 943-949
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2017 > 11 > 2 > 305-314
Semiconductors > 2017 > 51 > 3 > 387-391
Metallurgist > 2016 > 60 > 5-6 > 571-575
Semiconductors > 2016 > 50 > 9 > 1231-1235
Metallurgist > 2015 > 59 > 5-6 > 518-525
Inorganic Materials > 2014 > 50 > 3 > 215-221
Metallurgist > 2013 > 56 > 11-12 > 952-956
Metallurgist > 2013 > 57 > 5-6 > 455-459
Metallurgist > 2013 > 57 > 3-4 > 346-351
Metallurgist > 2012 > 55 > 11-12 > 859-864