Search results for: O. A. Novodvorsky
Semiconductors > 2019 > 53 > 2 > 160-164
Semiconductors > 2018 > 52 > 11 > 1424-1427
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2018 > 12 > 2 > 328-331
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2018 > 12 > 2 > 322-327
Technical Physics Letters > 2018 > 44 > 3 > 271-274
Semiconductors > 2018 > 52 > 2 > 260-263
Inorganic Materials > 2017 > 53 > 11 > 1120-1125
Semiconductors > 2017 > 51 > 3 > 407-411
Bulletin of the Russian Academy of Sciences: Physics > 2016 > 80 > 4 > 376-380
Inorganic Materials > 2016 > 52 > 3 > 268-273
Optical and Quantum Electronics > 2016 > 48 > 6 > 1-8
Optical and Quantum Electronics > 2016 > 48 > 7 > 1-8
Optical and Quantum Electronics > 2016 > 48 > 6 > 1-9
Semiconductors > 2015 > 49 > 5 > 563-569
Semiconductors > 2014 > 48 > 4 > 538-544
Inorganic Materials > 2014 > 50 > 9 > 897-902
Inorganic Materials > 2013 > 49 > 11 > 1123-1126
Bulletin of the Russian Academy of Sciences: Physics > 2012 > 76 > 10 > 1119-1122
Applied Physics B > 2011 > 105 > 3 > 545-550