Search results for: José L. Huertas
The International Series in Engineering and Computer Science
Journal of Electronic Testing > 2011 > 27 > 3 > 277-288
Journal of Electronic Testing > 2005 > 21 > 3 > 221-232
Microelectronics Journal > 2003 > 34 > 10 > 927-936
Microelectronics Journal > 2002 > 33 > 10 > 799-806
Analog Integrated Circuits and Signal Processing > 2002 > 32 > 2 > 187-190
Measurement > 2002 > 31 > 1 > 47-60
Journal of Electronic Testing > 2001 > 17 > 5 > 373-383
Analog Integrated Circuits and Signal Processing > 2000 > 23 > 3 > 199-210