Search results for: S. Philip
IEEE Electron Device Letters > 2018 > 39 > 1 > 23 - 26
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4928 - 4936
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4374 - 4385
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4496 - 4502
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 9 > 2263 - 2273
IEEE Electron Device Letters > 2017 > 38 > 7 > 863 - 866
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-3.1 - 5A-3.5
Computing in Science & Engineering > 2017 > 19 > 2 > 41 - 50
2016 IEEE International Electron Devices Meeting (IEDM) > 28.3.1 - 28.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 9.5.1 - 9.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 21.3.1 - 21.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 16.1.1 - 16.1.4