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We present in this paper a method for implementing moment functions in a CMOS retina for object localization, and pattern recognition and classification applications. The method is based on the use of binary patterns and it allows the computation of different moment functions such as geometric and Zernike moments of any orders by an adequate choice of the binary patterns. The advantages of the method...
Because of its large dimension and its high level of integration, the PICS (Passive Integration Connecting Substrate) developed by NXP prone to top to bottom metal short (TBMS) failure during temperature cycling test. Several options of process modifications as well as new design rules and stress relief patterns for preventing TBMS failure are described. These countermeasures have been evaluated under...
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