Search results for: Xiao Sun
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 463 - 479
Journal of Microelectromechanical Systems > 2012 > 21 > 6 > 1436 - 1444
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 463 - 479
Journal of Microelectromechanical Systems > 2012 > 21 > 6 > 1436 - 1444