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Reliability evaluation of Commercial off-the-shelf (COTS) processors against faults induced by radiation is a challenging problem. Some alternatives have been proposed to radiation test but they are very time consuming and lack of the observability needed. This work analyses the possibility to use an HDL model for estimating applications dependability on Texas Instruments MSP430 processor early in...
This paper remarks the importance of defining real conditions for the radiation effects evaluation on embedded systems using a fault injection system. The influence of fault latency on the experiment results is illustrated by means of a case study.
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