Search results for: D. I. Bilenko
Semiconductors > 2018 > 52 > 3 > 331-334
Technical Physics Letters > 2017 > 43 > 2 > 166-168
BioNanoScience > 2015 > 5 > 4 > 227-232
Semiconductors > 2015 > 49 > 3 > 325-330
Technical Physics Letters > 2015 > 41 > 11 > 1061-1064
Metal Science and Heat Treatment > 2014 > 56 > 3-4 > 113-117
Semiconductors > 2014 > 48 > 12 > 1562-1566
Semiconductors > 2014 > 48 > 10 > 1370-1373
Russian Journal of Nondestructive Testing > 2004 > 40 > 8 > 565-568