Search results for: In
IEEE Electron Device Letters > 2017 > 38 > 7 > 883 - 886
IEEE Electron Device Letters > 2017 > 38 > 5 > 580 - 583
IEEE Electron Device Letters > 2017 > 38 > 4 > 481 - 484
IEEE Electron Device Letters > 2017 > 38 > 4 > 473 - 476
IEEE Electron Device Letters > 2016 > 37 > 12 > 1570 - 1573
IEEE Electron Device Letters > 2016 > 37 > 3 > 295 - 298
IEEE Electron Device Letters > 2016 > 37 > 1 > 39 - 42
IEEE Electron Device Letters > 2016 > 37 > 6 > 747 - 750
IEEE Electron Device Letters > 2016 > 37 > 6 > 739 - 742
IEEE Electron Device Letters > 2015 > 36 > 12 > 1332 - 1335
IEEE Transactions on Electron Devices > 2015 > 62 > 12 > 4057 - 4062
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3653 - 3657
IEEE Electron Device Letters > 2015 > 36 > 6 > 579 - 581
IEEE Electron Device Letters > 2015 > 36 > 5 > 466 - 468
IEEE Communications Surveys & Tutorials > 2015 > 17 > 4 > 2102 - 2135
IEEE Electron Device Letters > 2014 > 35 > 12 > 1260 - 1262
IEEE Electron Device Letters > 2014 > 35 > 10 > 1037 - 1039
IEEE Electron Device Letters > 2014 > 35 > 10 > 1043 - 1045
Journal of the Korean Physical Society > 2014 > 65 > 10 > 1555-1558
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3465 - 3473