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RTN (Random Telegraph Noise) impact on data-retention failure/recovery mechanism has been investigated in scaled (∼1Ynm) 2-dimensional (2D) TLC (3bits/cell) NAND flash memories. The data-retention failure is caused by the electron de-trapping from the tunnel oxide in memory cells, which have 5∼8 times higher population of large threshold voltage shift by RTN (ΔVTH_RTN) than normal memory cells. Also,...
Solid-state drives (SSDs) have a growing trend of replacing hard disk drives (HDDs) in large computing systems to meet the requirements of power and space. Data in SSD are stored in NAND flash memory cells. Since 2-dimensional (2D) scaling is facing various limitations, 3D-NAND flash memory architectures have been proposed to maintain the trend of bit density increase and bit cost reduction, which...
The required storage class memory (SCM) capacity and NAND over-provisioning (OP) for SCM/NAND hybrid enterprise solid state drive (SSD) are evaluated for various storage workloads. From the worst case simulations (hot and random data intensive workloads), it is found that less than 8% SCM/NAND capacity ratio with below 25% NAND OP is sufficient assuming SCM bit cost is 10-times as high as that of...
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