Search results for: Houman Homayoun
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 63 - 72
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 96 - 109
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2538 - 2551
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 1 > 1 - 20
Microelectronics Reliability > 2016 > 62 > C > 156-166