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Radiation hardness of active EEE electronic devices with regards to space environment is characterized according to two main aspects: cumulated effects and single event effects. The radiation qualification process includes Total Ionizing Dose (TID), Total Non-Ionizing Dose (TNID) and Single Event Effect (SEE) tests, usually performed independently. The aim of this study is to evaluate the potential...
Radiation analyses in the space industry rely more and more on Reverse Monte Carlo radiation transport calculation tools. These tools allow engineers to compute deposited dose and transmitted fluence in complex geometrical models, taking into account particle physical interactions with matter. Despite their widespread use, few studies exist that compare Monte Carlo tools or validate Monte Carlo Reverse...
Process-induced variability between parts and lots is a critical issue for space applications and Radiation Hardness Assurance (RHA). The one-sided tolerance limit method is commonly used to take this variability into account. This study explores the possibility to consider a more sophisticated statistical analysis. The impact of the current trend to reduce the number of tested parts for radiation...
CARMEN is a CNES scientific equipment able to measure electron and proton fluxes and to detect radiation effects on electronic devices. SEU rates for two SSRAM devices on board the CARMEN1 and CARMEN2 experiments are investigated. SEU induced by trapped protons are studied for CARMEN2 whereas the impact of the March 2012 solar flare is studied for CARMEN1. SEU rates are estimated using two different...
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