Search results for: Attilio Di Nisio
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 10 > 2535 - 2544
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 2 > 305 - 314
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 9 > 1968 - 1976
Quality and Reliability Engineering International > 31 > 7 > 1209 - 1222
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 5 > 1158 - 1169
Measurement > 2015 > 61 > Complete > 88-99
Measurement > 2014 > 54 > Complete > 241-248
IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 5 > 1163 - 1170
IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 5 > 1106 - 1115
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 5 > 1334 - 1342
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 5 > 1613 - 1622
Computer Standards & Interfaces > 2010 > 32 > 3 > 119-125
Measurement > 2009 > 42 > 9 > 1304-1311