The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In this work, a CMOS transistor array is presented, which allows performing process variability, Random Telegraph Noise and BTI/CHC aging characterization in a single chip. The array, called ENDURANCE, integrates 3136 MOS transistors, for single and massive electrical testing. This chip, together with a dedicated measurement set-up, allows programming any of these electrical tests, considerably reducing...
This paper presents a toolbox for the automation of the electrical characterization of CMOS transistors. The developed software provides a user-friendly interface to carry out different tests to evaluate time-zero (i.e., process) and time-dependent variability in CMOS devices. Also, the software incorporates a post-processing capability that allows users to visualize the data. Moreover, without loss...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.