Search results for: Jorg Henkel
Integration, the VLSI Journal > 2018 > 60 > C > 132-152
IEEE Design & Test > 2017 > 34 > 6 > 4 - 5
IEEE Design & Test > 2017 > 34 > 5 > 4
IEEE Embedded Systems Letters > 2017 > 9 > 3 > 77 - 80
IEEE Design & Test > 2017 > 34 > 4 > 4
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 6 > 1054 - 1058
IEEE Transactions on Computers > 2017 > 66 > 6 > 957 - 970
IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Design & Test > 2017 > 34 > 3 > 4 - 5
IEEE Transactions on Parallel and Distributed Systems > 2017 > 28 > 5 > 1315 - 1330
IEEE Transactions on Computers > 2017 > 66 > 4 > 647 - 660
IEEE Transactions on Computers > 2017 > 66 > 4 > 560 - 574
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-3.1 - CR-3.6
IEEE Design & Test > 2017 > 34 > 2 > 4
IEEE Transactions on Computers > 2017 > 66 > 3 > 515 - 530
IEEE Transactions on Computers > 2017 > 66 > 3 > 488 - 501