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With the continued down-scaling of IC technology and increase in manufacturing process variations, it is becoming ever more difficult to accurately estimate circuit performance of manufactured devices. This poses significant challenges on the effective application of adaptive voltage scaling (AVS) which is widely used as the most important power optimization method in modern devices. Process variations...
Process variation occurring during fabrication of complex VLSI devices induce uncertainties in operation parameters (e.g., supply voltage) to be applied to each device in order for it to fit within the allowed power budget and get the optimum power efficiency. Therefore, an efficient post manufacturing performance estimation mechanism is needed in order to tune operation parameters for each device...
To overcome the increasing sensitivity to variability in nanoscale integrated circuits, operation parameters (e.g., supply voltage) are adapted in a customized way exclusively to each chip. A standard industrial approach to achieve customized circuit adaptations is the use of on-chip monitors that allow fast performance evaluation during production or lifetime. Such on-chip monitoring approaches estimate...
Circuit monitoring techniques have been adopted widely to compensate for process, voltage, and temperature variations as well as power optimization of integrated circuits. For cost and complexity reasons, these techniques are usually implemented by means of performance monitors allowing fast performance evaluation during production. In this paper, we demonstrate the limitations of performance monitoring...
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