Search results for: Weifeng Sun
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3275 - 3281
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 458 - 460
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 229 - 233
IEEE Electron Device Letters > 2013 > 34 > 8 > 1032 - 1034
Microelectronics Journal > 2011 > 42 > 5 > 609-613