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Although constant technology scaling has resulted in considerable benefits, smaller device dimensions, higher operating temperatures and electric fields have also contributed to faster device aging due to wearout. Not only does this result in the shortening of processor lifetimes, it leads to faster wearout resultant performance degradation with operating time. Instead of taking a reactive approach...
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges when trying to maintain manufacturing yield rates and devices which will be reliable throughout their lifetime. New microarchitectures require new reliability-aware design methods that can face these challenges without...
New applications demand very high processing power when run on embedded systems. Very Long Instruction Word (VLIW) architectures have emerged as a promising alternative to provide such processing capabilities under the given energy budget. However, in this new VLIW-based architectures, the register file is a very critical contributor to the overall power consumption and new approaches have to be proposed...
Tomorrow's embedded devices need to run high-resolution multimedia as well as need to support multi-standard wireless systems which require an enormous computational complexity with a very low energy consumption and very high performance constraints. In this context, the register file is one of the key sources of power consumption and performance bottleneck, and its inappropriate design and management...
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