Search results for: Seyed Ghassem Miremadi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3138 - 3151
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 10 > 1725 - 1738
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 481 - 489
IEEE Transactions on Multi-Scale Computing Systems > 2017 > 3 > 3 > 181 - 192
IEEE Transactions on Parallel and Distributed Systems > 2017 > 28 > 6 > 1564 - 1577
Microprocessors and Microsystems > 2017 > 50 > C > 127-137
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 3 > 1012 - 1022
IEEE Transactions on Computers > 2016 > 65 > 12 > 3661 - 3675
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 11 > 3296 - 3309
Microprocessors and Microsystems > 2016 > 45 > PB > 283-296
Microelectronics Reliability > 2016 > 63 > C > 304-313