Search results for: Chris H. Kim
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
IEEE Journal of Solid-State Circuits > 2017 > 52 > 6 > 1655 - 1663
2015 IEEE International Electron Devices Meeting (IEDM) > 20.7.1 - 20.7.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
2015 IEEE International Reliability Physics Symposium > 6A.3.1 - 6A.3.5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 2 > 280 - 291
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 607 - 615
2012 International Electron Devices Meeting > 9.7.1 - 9.7.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 2F.5.1 - 2F.5.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 4C.1.1 - 4C.1.8
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 3 > 584 - 593
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2374 - 2385
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 947 - 956