Search results for: Chris H. Kim
2015 IEEE International Electron Devices Meeting (IEDM) > 20.7.1 - 20.7.4
2015 IEEE International Reliability Physics Symposium > 6A.3.1 - 6A.3.5
2012 International Electron Devices Meeting > 9.7.1 - 9.7.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 2F.5.1 - 2F.5.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 4C.1.1 - 4C.1.8
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4