Search results for: Chris H. Kim
IEEE Journal of Solid-State Circuits > 2017 > 52 > 6 > 1655 - 1663
2015 IEEE International Electron Devices Meeting (IEDM) > 20.7.1 - 20.7.4
2015 IEEE International Reliability Physics Symposium > 6A.3.1 - 6A.3.5
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 3 > 584 - 593
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 947 - 956