Search results for: Chris H. Kim
IEEE Transactions on Information Forensics and Security > 2018 > 13 > 1 > 79 - 93
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
IEEE Journal of Solid-State Circuits > 2017 > 52 > 6 > 1655 - 1663
2017 IEEE International Reliability Physics Symposium (IRPS) > SE-7.1 - SE-7.4
IEEE Journal of Solid-State Circuits > 2017 > 52 > 3 > 799 - 811
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 2 > 201 - 213