Search results for: Soon-Jyh Chang
2007 IEEE Custom Integrated Circuits Conference > 213 - 216
Journal of Electronic Testing > 2007 > 23 > 6 > 549-558
2006 IEEE Asian Solid-State Circuits Conference > 159 - 162
2006 IEEE Asian Solid-State Circuits Conference > 351 - 354
2006 IEEE International Symposium on Circuits and Systems > 4 pp. - 4332
Journal of Electronic Testing > 2002 > 18 > 6 > 571-581