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During post-silicon validation and debug, one or more manufactured integrated circuits (ICs) are tested in actual system environments to detect and fix design flaws (bugs). According to several industrial reports, the costs of post-silicon validation and debug are rising faster than design costs. Hence, new techniques are essential to reverse this trend. QED, an acronym for Quick Error Detection,...
We present a new technique for systematically creating postsilicon validation tests that quickly detect bugs in processor cores and uncore components (cache controllers, memory controllers, on-chip networks) of multi-core System on Chips (SoCs). Such quick detection is essential because long error detection latency, the time elapsed between the occurrence of an error due to a bug and its manifestation...
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