Search results for: Sule Ozev
Journal of Electronic Testing > 2019 > 35 > 3 > 335-347
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 6 > 1043 - 1053
IEEE Sensors Journal > 2017 > 17 > 3 > 695 - 708
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 6 > 2286 - 2298
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 183 - 193
IEEE Journal of Solid-State Circuits > 2016 > 51 > 5 > 1313 - 1324
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 4 > 1493 - 1502
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1179 - 1183