Search results for: Yamin Zhang
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2166 - 2171
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 978 - 982
IEEE Electron Device Letters > 2014 > 35 > 3 > 345 - 347
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2166 - 2171
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 978 - 982
IEEE Electron Device Letters > 2014 > 35 > 3 > 345 - 347