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We present a compact model for the quasi-static coupling impedance between two coplanar rectangular contacts, which are misaligned and non-identical, on a bulk substrate. The coupling resistance is modeled as weighted arithmetic mean of the resistances of four aligned identical contact geometries for which a model is available in literature. Our model is scalable with contact dimensions and separation...
A new approach is presented for modeling the resistances of the substrate coupling network employed for noise calculations in the design of mixed-signal and RF ICs. The approach introduces intermediate resistances having progressively simpler current flow patterns than the coupling resistances. Each coupling resistance is then modeled as the product of two resistance ratios and a resistance having...
We derive a closed-form quasi-static model for the coupling impedance between aligned coplanar rectangular contacts on bulk and epitaxial semiconductor substrates by resolving the 3-D field lines into simpler components (vertical, lateral, fringing, 2-D, etc.). Both insulating and conducting (grounded or floating) backplane conditions are considered. Our model reflects all the geometry and process...
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