Search results for: Hyeokjin Kim
Microelectronics Reliability > 2017 > 72 > C > 98-102
IEEE Transactions on Power Electronics > 2017 > 32 > 1 > 98 - 116
IEEE Transactions on Power Electronics > 2016 > 31 > 1 > 101 - 110
Microelectronics Reliability > 2014 > 54 > 11 > 2383-2387
IEEE Transactions on Power Electronics > 2014 > 29 > 7 > 3403 - 3413
Microelectronics Reliability > 2013 > 53 > 9-11 > 1351-1354