Search results for: Leibing Shi
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1627 - 1635
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1636 - 1641
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1627 - 1635
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1636 - 1641