Search results for: Juin J. Liou
IEEE Electron Device Letters > 2012 > 33 > 5 > 640 - 642
IEEE Electron Device Letters > 2012 > 33 > 11 > 1595 - 1597
IEEE Electron Device Letters > 2012 > 33 > 6 > 860 - 862
IEEE Electron Device Letters > 2012 > 33 > 10 > 1345 - 1347
IEEE Electron Device Letters > 2012 > 33 > 10 > 1360 - 1362
Microelectronics Reliability > 2011 > 51 > 12 > 2137-2142
Microelectronics Reliability > 2011 > 51 > 12 > 2147-2152
Microelectronics Reliability > 2011 > 51 > 12 > 2015-2030
2011 9th IEEE International Conference on ASIC > 256 - 258
IEEE Electron Device Letters > 2011 > 32 > 9 > 1200 - 1202
IEEE Electron Device Letters > 2011 > 32 > 7 > 967 - 969
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2974 - 2980
Solid State Electronics > 2010 > 54 > 12 > 1641-1643
Microelectronics Reliability > 2010 > 50 > 3 > 365-369