Search results for: Juin J. Liou
Microelectronics Reliability > 2016 > 66 > C > 46-51
Microelectronics Reliability > 2015 > 55 > 11 > 2236-2246
IEEE Electron Device Letters > 2015 > 36 > 5 > 424 - 426
2014 IEEE International Reliability Physics Symposium > EL.2.1 - EL.2.4
Solid State Electronics > 2010 > 54 > 12 > 1641-1643
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2736 - 2743