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As CMOS technology scales down, multiple cell upsets (MCUs) caused by a single radiation particle have become one of the most challenging reliability issues for memories in space applications. In general, bits affected by MCUs are usually physically close. Error correction codes (ECCs) are commonly used to protect memory against MCUs. Recently, Matrix-based codes are an interesting option due to their...
Transient multiple cell upsets (MCUs) are becoming major issues in the reliability of memories exposed to radiation environment. Error correction codes (ECCs) are commonly used to protect memories against MCUs. Among ECCs, matrix codes have obvious advantages due to the simplicity of the encoding and decoding algorithm that enables low overheads. However, an important issue is that when ECCs are used,...
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