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In this paper, we present a novel on-chip path delay measurement architecture for efficiently detecting and debugging of delay faults in the fabricated integrated circuits. Several delay stages are employed in the proposed on-chip path delay measurement (OCDM) circuit, whose delay ranges are increased by a factor of two gradually from the last to the first delay stage. Thus, the proposed OCDM circuit...
This paper proposes a unified delay test architecture, in which the design resources for on-line delay fault detection can be reused to support off-line delay testing. A stability checker, which has low hardware overhead, is presented to monitor the stability violation from each critical combinational output. A global error generator, which is shared among stability checkers, can produce a global...
Faster-than-at-speed testing provides an effective way for detecting and debugging small delay defects in modern fabricated chips. However, the use of external automatic test equipment for faster-than-at-speed delay testing could be costly. In this paper, we present an on-chip clock generation scheme which facilitates faster-than-at-speed delay testing for both launch on capture and launch on shift...
In this paper, we present a novel on-chip path delay measurement circuit for efficiently detecting and debugging of delay faults in the fabricated integrated circuits. Several delay stages are employed in the proposed circuit, whose delay ranges are increased by a factor of two gradually from the last to the first delay stage. Thus, the proposed method can achieve a large delay measurement range with...
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