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In this manuscript, we investigated the fundamental mechanism of stress relaxation phenomenon by employing finite element simulation. Through finite element simulations, the evolution of stress distribution, deformation field and the interaction force was wholly recorded during both the loading and stress relaxation stages. With the developed simulation model, the sensitivity of force-time curves...
Atomic force microscopy (AFM) and dielectrophoresis (DEP) technologies have been used as excellent tools for nanomanipulation and nanoassembly. AFM-based manipulation exhibits excellent positioning and very high accuracy. The advantage of DEP is its ability to carry out parallel and massive manipulation of nanomaterials. In this study, we develop AFM tip-induced dielectrophoresis for three dimensional...
The invention of atomic force microscopy (AFM) provides new technology for investigating the physiological activities at the single cell and single molecule levels. Lymphoma Raji cells were adsorbed onto the glass slides by coating the glass slides with poly-L-lysine. Rituximabs (anti-CD20 antibody) were linked onto the AFM tip by PEG linker and the CD20-Rituximab binding forces were measured on three...
The invention of atomic force microscopy (AFM) provides new technology for measuring the molecular specific binding forces. With the use of AFM single-molecule force spectroscopy (SMFS), the CD20-rituximab binding forces were measured on purified CD20 proteins (CD20 segment protein and CD20 full-length protein) and on Burkitt's lymphoma Raji cells, respectively. With AFM probe functionalization technology,...
Rapid progress in graphene-based applications is calling for an inexpensive technique for creating mass graphene components with specialized shapes, sizes, and edge structures. In this paper, an Atomic Force Microscopy (AFM) based mechanical cutting method is developed to approach this goal, through which we are able to structure trenches into multilayer graphene flakes with different directions,...
The main problem of atomic force microscopy (AFM)-based nanomanipulation is the lack of real-time visual feedback. Although this problem has been partially solved by virtual reality technology, the faulty display caused by random drift and modeling errors in the virtual reality interface are still limiting the efficiency of the AFM-based nanomanipulation. Random drift aroused from an uncontrolled...
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