Search results for: R. Rodriguez
IEEE Electron Device Letters > 2017 > 38 > 4 > 457 - 460
2013 IEEE International Reliability Physics Symposium (IRPS) > ER.2.1 - ER.2.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 5D.4.1 - 5D.4.6
2013 Spanish Conference on Electron Devices > 281 - 284
2009 IEEE International Reliability Physics Symposium > 1028 - 1032
2009 Spanish Conference on Electron Devices > 238 - 241