Search results for: Meng Zhang
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4875 - 4881
IEEE Electron Device Letters > 2017 > 38 > 12 > 1676 - 1679
IEEE Electron Device Letters > 2017 > 38 > 11 > 1563 - 1566
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4057 - 4064
IEEE Electron Device Letters > 2017 > 38 > 10 > 1421 - 1424
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3174 - 3182
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2592 - 2598
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 432 - 437
IEEE Electron Device Letters > 2017 > 38 > 1 > 52 - 55
IEEE Electron Device Letters > 2016 > 37 > 11 > 1458 - 1461
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3964 - 3970
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3206 - 3212
IEEE Electron Device Letters > 2014 > 35 > 5 > 548 - 550
IEEE Electron Device Letters > 2013 > 34 > 1 > 60 - 62
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1730 - 1737
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 4 > 760 - 764