Search results for: Qingming Xin
Microelectronics Reliability > 2017 > 78 > C > 25-37
IEEE Transactions on Plasma Science > 2015 > 43 > 5-1 > 1368 - 1376
IEEE Transactions on Plasma Science > 2013 > 41 > 5-1 > 1231 - 1236
IEEE Transactions on Plasma Science > 2013 > 41 > 5-1 > 1243 - 1246
IEEE Transactions on Industrial Electronics > 2013 > 60 > 11 > 4891 - 4902