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This contribution summarizes the latest Technical Report of the ANSI/ESDA Working Group 5.4 Transient Latch-up (TLU). 18 case studies are described and classified with respect to occurrence of the TLU, trigger, and sensitivity to static latch-up tests. Based on the classification, next steps towards a TLU test methodology are discussed.
Due to downscaling of technology and increase of package size, a reduction in economically achievable CDM robustness of ICs is predicted. The workshop addresses the options and the status of CDM control in manufacturing and testing environments. The necessity of developing more advanced CDM control methods will be discussed. Another question is about the best way for world-wide implementation of advanced...
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