Search results for: Thiago R. dos Santos
Statistics for Industry and Technology > Advances in Degradation Modeling > Degradation Models > 157-180
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2012 > 34 > 8 > 1520 - 1532
Statistics for Industry and Technology > Advances in Degradation Modeling > Degradation Models > 157-180
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2012 > 34 > 8 > 1520 - 1532