The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The bias-enhanced performance of visible-blind ultraviolet (UV) detection of GaN Schottky barrier diodes has been studied. The UV response of the Schottky diodes was found to be vastly amplified at elevated reverse bias, leading to the observation of the voltage-dependent gain arising from the defect-induced Schottky barrier lowering effect. In contrast, the visible light response of the GaN Schottky...
Finite Element (FE) simulation is an effective approach to investigate the thermal stress status and the reliability trend when qualifying a new packaging material going through the reliability test. However, simulation of thermal stresses in gold wires was rarely reported in previous days due to the hardness in FE model building. This study performs 3D modeling to evaluate the thermal stresses in...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.