Search results for: Jerzy Dabrowski
Journal of Electronic Testing > 2019 > 35 > 1 > 77-85
Journal of Applied Crystallography > 50 > 5 > 1376 - 1381
International Journal of Circuit Theory and Applications > 44 > 5 > 1071 - 1093
IEEE Transactions on Circuits and Systems II: Express Briefs > 2015 > 62 > 5 > 421 - 425
Integration, the VLSI Journal > 2015 > 49 > Complete > 14-21
Analog Integrated Circuits and Signal Processing > 2014 > 80 > 3 > 359-374
Analog Integrated Circuits and Signal Processing > 2012 > 70 > 1 > 79-90
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 11 > 2870 - 2876
Analog Integrated Circuits and Signal Processing > 2009 > 61 > 2 > 115-127
Analog Integrated Circuits and Signal Processing > 2006 > 49 > 2 > 115-122
Analog Integrated Circuits and Signal Processing > 2006 > 49 > 2 > 151-160
Roczniki Nauk Społecznych > 2004 > 32 > 3 > 85-96
Analog Integrated Circuits and Signal Processing > 1998 > 16 > 2 > 91-99