The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This work shows the effect of the conductor surface roughness (CSR) in the measurement of the loss tangent using the microstrip ring resonator method (RRM) in three low-loss, organic dielectric substrates (RT/duroid 6002, 6202 and 5880) and each, with two types of copper metallization. In addition, relative permittivity and loss tangent measurements are presented from 30 GHz to 70 GHz for the three...
For the first time, the thermal stability of the dielectric properties, i.e. the relative permittivity and the loss tangent, are presented for RT/duroid® 6002 from 30 GHz to 70 GHz over the temperature range between 20°C and 200°C, using the microstrip ring resonator method at two different microstrip impedances. High-frequency-resolution, Multiline TRL calibrations were performed at each temperature...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.