Search results for: Wen-Yan Yin
International Journal of RF and Microwave Computer‐Aided Engineering > 30 > 9 > n/a - n/a
IEEE Transactions on Nanotechnology > 2017 > 16 > 6 > 1132 - 1137
Microelectronics Reliability > 2017 > 78 > C > 362-369
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 10 > 1702 - 1712
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 5 > 1541 - 1548
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 5 > 1650 - 1653
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 5 > 1523 - 1531
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3647 - 3653
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3802 - 3807
IEEE Microwave and Wireless Components Letters > 2017 > 27 > 7 > 639 - 641
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 3 > 902 - 909
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 2-2 > 646 - 653